The WIMM houses several core pieces of equipment and reagents for both classical genetic analysis and high-throughput/systems-level analysis in budding yeast (Saccharomyces cerevisiae). For classical and low-throughput genetics, molecular and cell biology, expertise and a large range of cloning, tagging and expression vectors are available. Specific additional technology and resources available locally include:
Following mating of haploid yeast strains and subsequent sporulation, this microscope allows dissection of yeast tetrads, asci containing four spores that are meiotic progeny. This is essential for classical, low-throughput genetic analysis, synthetic lethality analysis and a ‘clean’ way of creating double/multiple mutant strains through genetic crosses.
This collection was developed by the Saccharomyces Genome Deletion Project, and includes knock-out strains covering 96% of the yeast non-essential genome (approx. 4800 strains). The distinct tags flanking the disruption cassette, also known as "molecular barcodes", uniquely identify each strain allowing phenotypic analysis approaches to be performed on genome-wide level (synthetic lethality analysis by microarray, or SLAM). At the WIMM we have the haploid deletion collection in an ‘a-mating type’ background.
The Yeast ORF library consists of over 4,900 yeast open reading frames (ORFs) that have been adapted for use with the Gateway system. The ORFs are expressed as a C-terminal fusion protein (6xHis-HA, cleavable) under control of a regulatable GAL promoter.
Ooi SL et al. Global synthetic-lethality analysis and yeast functional profiling. Trends Genet. 2006 22:56-63.